YB3116A集成電路測(cè)試器
YB3116A集成電路測(cè)試器產(chǎn)品介紹（中文）
YB3116A是一款專業(yè)用于數(shù)字集成電路功能檢測(cè)的儀器設(shè)備，適用于科研機(jī)構(gòu)、電子制造業(yè)及教育領(lǐng)域的集成電路性能驗(yàn)證工作。該設(shè)備采用模塊化設(shè)計(jì)，可支持TTL 54/74系列、55/75系列、CMOS 4000/4500系列以及常見RAM、EPROM存儲(chǔ)器芯片的測(cè)試，同時(shí)兼容CPU接口電路和光電耦合器件等多種數(shù)字元件的功能診斷。測(cè)試系統(tǒng)通過(guò)繼電器矩陣實(shí)現(xiàn)多通道切換，具備8種可調(diào)電源參數(shù)、多種負(fù)載電流選擇及功耗測(cè)試功能，支持全中文操作界面和自動(dòng)型號(hào)識(shí)別。整機(jī)采用緊湊型設(shè)計(jì)（100×220×350mm），重量約2.5kg，便于實(shí)驗(yàn)室或生產(chǎn)現(xiàn)場(chǎng)使用。其特色功能包括智能程序調(diào)試、EPROM數(shù)據(jù)復(fù)制修改組合等，為電子設(shè)備維修和教學(xué)實(shí)驗(yàn)提供高效測(cè)試方案。139
YB3116A IC Tester Product Introduction (English)
The YB3116A is a digital integrated circuit testing instrument designed for functional verification of logic devices in R&D, manufacturing and educational scenarios. Featuring a slot-based architecture with 10 universal slots, it supports comprehensive testing of TTL 54/74 series, 55/75 series, CMOS 4000/4500 series ICs, along with common memory chips including RAM and EPROM. The system integrates PCI interface for PC connectivity, allowing automated testing procedures through relay matrix channel switching. With adjustable power supplies (8 voltage options), configurable load currents and power consumption measurement, it provides parameter comparison and fault diagnosis capabilities. The compact chassis (100H×220W×350D) houses intuitive Chinese/English menu-driven controls, supporting features like EPROM data manipulation and microcontroller peripheral circuit testing. Ideal for production line QA checks and electronics engineering labs, it balances portability with versatile testing coverage. 2512
技術(shù)特點(diǎn)補(bǔ)充說(shuō)明
設(shè)備采用動(dòng)態(tài)測(cè)試方法，可捕捉瞬態(tài)信號(hào)異常，內(nèi)置的智能算法能自動(dòng)匹配器件標(biāo)準(zhǔn)參數(shù)并進(jìn)行偏差分析。測(cè)試內(nèi)容覆蓋輸入輸出特性、傳輸延遲和噪聲容限等關(guān)鍵指標(biāo)，對(duì)于混合信號(hào)器件提供專用測(cè)試模式。用戶可通過(guò)歷史數(shù)據(jù)對(duì)比功能追蹤器件性能變化趨勢(shì)，配套軟件支持測(cè)試報(bào)告生成和數(shù)據(jù)導(dǎo)出。特殊設(shè)計(jì)的DUT接口適配器兼容DIP/SOP封裝，確保測(cè)試接觸可靠性。4613
Enhanced Technical Features
The testing platform employs real-time signal sampling technology to capture glitches and timing violations, with built-in self-calibration routines ensuring measurement consistency. Advanced features include programmable test sequences for batch testing, pulse width analysis for clock-dependent devices, and leakage current measurement for quality screening. The thermal-compensated circuitry maintains accuracy across 0-40°C operating range, while the ergonomic front panel provides direct access to frequency/voltage adjustment controls. Optional accessories extend testing capability to programmable logic devices and LED display drivers. 71115
簡(jiǎn)單介紹
各種智能儀器程序的復(fù)制、保存：中小規(guī)模程序的調(diào)試：EPROM、E。PROM器件的復(fù)制、修改、組合：檢驗(yàn)新購(gòu)器件的質(zhì)量：測(cè)試內(nèi)容豐富：YB3116A 集成電路測(cè)試器
YB3116A 集成電路測(cè)試器
的詳細(xì)介紹
各種智能儀器程序的復(fù)制、保存：
中小規(guī)模程序的調(diào)試：
EPROM、E。PROM器件的復(fù)制、修改、組合：
檢驗(yàn)新購(gòu)器件的質(zhì)量：
測(cè)試內(nèi)容豐富：
體積小、重量輕、性價(jià)比高。 |
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YB3116A
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| ·可測(cè)試TTL74/54、55/75、CMOS40、45、14系列 |
| ·常用RAM、EPROM、E^2PROM、光電耦合器、單片機(jī)系列 |
| ·常用微機(jī)外圍電路系列、LED顯示器系列 |
| ·外形尺寸：100H×220W×350D(mm) |
| ·質(zhì)量：約2.5kg |
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